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Analytical technics

Material analysis which is neccesary for material design and evaluation is performed with scanning electron microscope (SEM-EDX), X-ray fluorescence spectrometer, atomic force microscope (AFM), thermal analysis equipment (DSC, TG-DTA, TMA).

Analytical equipment

Scanning electron microscope (SEM-EDX)

Scanning electron microscope (SEM-EDX)

Material surface and minute substance are observed. Elemental analysis is also available.

X-ray fluorescence spectrometer (XRF)

X-ray fluorescence spectrometer (XRF)

Elemental analysis and thickness measurement of inorganic substance is performed.

Atomic force microscope (AFM)

Atomic force microscope (AFM)

Surface geometry of material is measured in nano scale.

Thermal analysis

Thermal analysis

Thermal properties, such as glass trasition temperature (Tg), melting point (Tm), exo and endotherm, thermal decomposition behavior, coefficient of thermal expansion (CTE) are measured with DSC, TG-DTA and TMA.